Faculdade de Ciências e Tecnologia

Microelectronics II

Code

11045

Academic unit

Faculdade de Ciências e Tecnologia

Department

Departamento de Ciências dos Materiais

Credits

6.0

Teacher in charge

Luís Miguel Nunes Pereira

Weekly hours

6

Total hours

90

Teaching language

Português

Objectives

The UC of Microeletrónica II aims to give continuity to Microeletrónica I, transmitting to the student an advanced formation in materials and devices for microelectronics (conventional and new ones), complementary processing techniques and miniaturization (and its challenges).

Prerequisites

In the UC of Microeletrónica II there is no mandatory precedence. However, it is recommended that students have some well-structured knowledge from previous semesters UCs such as Materiais Semicondutores, Electrónica (I and II) e Microeletrónica I.

Subject matter

1. Miniaturization

Moores’ Law and challenges; Tolerances and rules of circuit layout


2. Materials

The crystalline and polycrystalline silicon; Dielectrics; Materials of low permittivity; Metals and alloys

3.Additional ICs processing techniques

Epitaxy, CVD and its variants, namely, PECVD, LPCVD, APCVD, MOCVD and ALD

4. Lithography and erosion

High-definition photolithography; Electron beam lithography; X-ray lithography; Ion projection lithography; Laser scribing; Alternative patterning techniques: inkjet, embossing (nanoimprinting); Wet etching; Dry etching

5. MEMS

6. New materials

Semiconductor oxides; Nanomaterials and nanostructures

7. The future of Microelectronics


Starting on 2016/17

Introduction

  • Presentation and review of diode junctions

Devices

  • Bipolar

  • JFETs

  • MOSFETs

  • CMOS

  • TFTs

  • EGFETs

 

Miniaturization

  • Moore''s Law and challenges;

  • Materials

  • Strain silicon

  • Silicon on insulator ◦

  • high k dieletrics 

  • low k materiais for interconnects

  • metais and alloys

MEMS

  • type of structures

  • applications

  • production Process

  • NEMS

Future of microelectronics

  • Transistors with 1 and 2D materials, Resonance tunnel diodes / single electron transistors


Bibliography

  • Semiconductor Integrated Circuit Processing Technology, W. R. Runyan, K. E. Bean, Addison-Wesley; Revised edition, 1990
  • ULSI technology, C. Y. Chang, S. M. Sze, McGraw-Hill, 1996
  • Microelectronic processing: an introduction to the manufacture of integrated circuits, Walter Scot Ruska, McGraw-Hill, 1987
  • Microelectronic Circuits, Adele Sedra, Keneth Smith, Oxford University Press, 4th edition, 1997
  • The Science and Engineering of Microelectronic Fabrication, Stephen A. Campbell, Oxford University Press, 2 edition, 2001
  • Microelectronics Circuit Analysis and Design, Donald Neamen, McGraw-Hill, 4th edition, 2009
  • Transparent electronics: from synthesis to devices, edited by Antonio Facchetti e Tobin Marks, Wiley 2010
  • Transparent oxide electronics: from materials to devices, P. Barquinha, R. Martins, L. Pereira, E. Fortunato, Wiley  2012)

Teaching method

The teaching of the UC’s subjects is divided in theoretical, theoretical-practical and laboratory, classroom lessons. In addition, there is tutorial teaching, monitoring of students, subject to review by the oral discussion.

Evaluation method

Final score
50% average test or exam
50% report score
Approval with frequency and weighted average> 9.5 V / Average of tests or exam> 9.5 V

Tests / Exam
2 tests (optional), minimum 8V
1 exam season

Reports
Group - lab classes (manufacture MEMS)
Delivery 15 days after the last class

Frequency
Presence at laboratory classes and score of the report> 9.5 V

Courses